Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

328 pages | English | ISBN-10: 0387465464 | ISBN-13: 978-0387465463

https://www.amazon.com/Defect-Oriented-Nano-Metric-Circuits-Frontiers-Electronic/dp/0387465464

 TO MAC USERS: If RAR password doesn't work, use this archive program: 

RAR Expander 0.8.5 Beta 4  and extract password protected files without error.

 TO WIN USERS: If RAR password doesn't work, use this archive program: 

Latest Winrar  and extract password protected files without error.

 Coktum   |